Mr. Raymond Frost Profile

Raymond Frost

Engineer at Teledyne DALSA Semiconductor

SPIE Involvement:

Author

Publications (7)

Proceedings Article | 23 July 2014 Paper

Technology and device-design enhancements for improved read noise performance in fully depleted CCDs

S. Holland, C. Bebek, F. Dion, R. Frost, R. Groulx, J. Lee, G. Wang

Proceedings Volume 9154, 91541E (2014) https://doi.org/10.1117/12.2057219

KEYWORDS: Charge-coupled devices, Transistors, Amplifiers, Optical amplifiers, Capacitance, Field effect transistors, Silica, CCD cameras, Diffusion, Electrodes

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Proceedings Article | 25 September 2012 Paper

CCD research and development at Lawrence Berkeley National Laboratory

C. Bebek, R. Coles, P. Denes, F. Dion, J. Emes, R. Frost, D. Groom, R. Groulx, S. Haque, S. Holland, A. Karcher, W. Kolbe, J. Lee, N. Palaio, N. Roe, C. Tran, G. Wang

Proceedings Volume 8453, 845305 (2012) https://doi.org/10.1117/12.926606

KEYWORDS: Charge-coupled devices, Semiconducting wafers, Amplifiers, CCD cameras, Silicon, Quantum efficiency, Absorption, Silica, Plasma enhanced chemical vapor deposition, Cameras

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Proceedings Article | 15 February 2012 Paper

Design of low-noise output amplifiers for P-channel charge-coupled devices fabricated on high-resistivity silicon

S. Haque, F. Dion, R. Frost, R. Groulx, S. Holland, A. Karcher, W. Kolbe, N. Roe, G. Wang, Y. Yu

Proceedings Volume 8298, 82980X (2012) https://doi.org/10.1117/12.905460

KEYWORDS: Transistors, Amplifiers, Charge-coupled devices, Capacitance, Diffusion, Silicon, Field effect transistors, Interference (communication), Resistors, Electrodes

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Proceedings Article | 19 January 2009 Paper

Very-large-area CCD image sensors: concept and cost-effective research

E. Bogaart, I. Peters, A. Kleimann, E.J. Manoury, W Klaassens, W.T.F.M. de Laat, C. Draijer, R. Frost, J. Bosiers

Proceedings Volume 7250, 725003 (2009) https://doi.org/10.1117/12.807540

KEYWORDS: Amplifiers, Semiconducting wafers, CCD image sensors, Imaging systems, Image sensors, Sensors, Electrons, Charge-coupled devices, Optical amplifiers, Microlens

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Proceedings Article | 5 May 2008 Paper

Challenges and innovations in very-large CCD and CMOS imagers for professional imaging

Jan Bosiers, Holger Stoldt, Wilco Klaassens, Bart Dillen, Inge Peters, Erik Bogaart, Raymond Frost, Laurens Korthout, Jurgen Timpert

Proceedings Volume 6996, 69960Z (2008) https://doi.org/10.1117/12.785847

KEYWORDS: Imaging systems, Charge-coupled devices, Semiconducting wafers, Amplifiers, Sensors, CCD image sensors, Manufacturing, Electrons, Image sensors, Medical imaging

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Proceedings Article | 7 March 2005 Paper

A high-speed high-sensitivity 1/2-inch 1M-pixel frame-transfer CCD imager for medical and industrial applications

Adriana Stravers-Cimpoiasu, Holger Stoldt, Wilco Klaassens, Raymond Frost, Jan Bosiers

Proceedings Volume 5677, (2005) https://doi.org/10.1117/12.585773

KEYWORDS: Sensors, Charge-coupled devices, Imaging systems, Electrons, Amplifiers, Metals, Clocks, Image storage, Optical amplifiers, Medical imaging

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Proceedings Article | 23 February 2005 Paper

Very-large-area imagers for professional DSC applications

Bart Dillen, Cees Draijer, Louis Meessen, Erik-Jan Manoury, Wilco Klaassens, Raymond Frost, Jan Bosiers

Proceedings Volume 5678, (2005) https://doi.org/10.1117/12.585736

KEYWORDS: Imaging systems, Silicon, CCD image sensors, Digital photography, Electronic imaging, Photovoltaics, Camera shutters, Lawrencium, Image resolution, Digital imaging

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Showing 5 of 7 publications

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